11. JTAG Interface Operation
11.1 Test Access Port (TAP)
The test access port (TAP) consists of four interface signals. These signals are used to control the serial loading and unloading of instructions and test data, as well as to execute tests.
The TAP consists of the following signals:
JTDI: Serial data input (Input signal)
JTDO: Serial data output (Output signal)
JTMS: Mode select (Input signal)
JTCK: Clock (Input signal)
The timing and the relationship of the TAP signals follows the IEEE 1149.1 standard protocol.
Copyright 1995, MIPS Technologies, Inc. -- 29 JAN 96
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